Wilkistar Otieno - Assistant Professor

Contact Information

Office Address:
EMS 1061
3200 North Cramer Street
Milwaukee, WI 53211
Phone: 414-229-3134
Fax: 414-229-6958
Email: otieno@uwm.edu

Mailing Address:
P.O. Box 784
Department of Industrial and Manufacturing Engineering
University of Wisconsin-Milwaukee
Milwaukee, WI 53201

Wilkistar Otieno


Ph.D., Industrial Engineering, University of South Florida, 2010
M.A., Statistics, University of South Florida, 2007
M.S.,  Industrial Engineering, University of South Florida, 2006
B.Tech., Mechanical and Production Engineering, Moi University, Kenya, 2002

Research Interests

  • Reliability Engineering
  • Nanoreliability, Statistical Analysis
  • Operations Research
  • K-12 Engineering and Science Education

Journal Publications

  1. Okogbaa, O.G., Daverakonda, L., Otieno, W., Albino,V., Analysis of Sequential Monitoring Schemes Using Natural Conjugate Priors, International Journal of Reliability, Quality and Safety Engineering, Vol. 17 No. 1, 2010, pp. 57-87
  2. Otieno, W., Okogbaa O. G., Reliability Modeling of Transistor Gates at the Nanoscale, IEEE  Explore-Reliability and Maintainability Symposium Proceedings, Fort Worth, TX, January, 2009, pp. 515 - 520
  3. Okogbaa, O. G., Otieno, W., Peng, X., Jain, S., Transient Analysis and Maintenance Intervention of Continuous Multi-unit, IIE Transitions, Vol. 40 No. 10, 2008, pp. 971-983
  4. Prieto, D., Rocha, P., Otieno, W. and Das. T., Work In Progress: Developing Elementary Science Teacher Training Modules Based On Doctoral Research in Engineering, Accepted In Proceedings of the Frontiers in Education conference, IEEE-ASEE, October 2010
  5. Nanduri, V., Otieno, W., Das, T. K., Savachkin, A., and Okogbaa, G. “Mentor Teacher Workshops: Train-the-Trainer Model of the USF STARS GK-12 Program,” Journal of Florida Association of Science Teachers, 2009

Book Chapter

  • Okogbaa, O. G., Otieno, W., Design for Maintainability”, Chapter 6, Environmentally Conscious Mechanical Design, Ed. Myer Kutz, Print ISBN: 9780471726364, Online ISBN: 9780470168202, John Wiley and Sons, NY, pp 185-247, 2007

Magazine Article

  • Okogbaa, G., Das, T. K., Martin-Vega, L., Centeno, G., Otieno, W., and Nanduri, V. “Educating the STARS,” Industrial Engineer Magazine, September, 2006

Selected Conference Presentations

  1. Otieno, W., Okogbaa O. G., Failure Density Estimation Using Kernels with Variable Bandwidths, INFORMS Annual Conference, Austin, TX, October 2010 
  2. Otieno, W., Okogbaa O. G., Reliability Modeling of Transistor Gates at the Nanoscale, IEEE  Reliability and Maintainability Symposium (RAMS), Fort Worth, TX, January 2009
  3. Otieno, W., Okogbaa O. G., Reliability, Failure and Intensity Function Estimation of Nanosystems, NIST’s Workshop on Materials Characterization for Nanoscale Reliability, Boulder, CO,  August, 2007 (NSF-NIST Travel Award).