Facilities

Advanced Analysis Facility

The Advanced Analysis Facility provides broad analytical service in materials analysis, e.g., x-ray diffraction (XRD), electron spectroscopy for chemical analysis (ESCA), scanning electron microscopy (SEM), atomic force microscopy (AFM), Fourier transform infrared spectroscopy (FTIR), and Raman spectroscopy.


Single Crystal Preparation Facility (Physics)

The crystal preparation laboratory which contains all the instruments for making oriented single crystal samples. These include an X-ray source, goniometer, and camera for orientation of single crystal boules. Thin discs can be cut from the boule using a Cambridge Instruments spark machine which is capable of slicing discs and spark polishing them. Finally, the sample can be mechanically polished using standard metallographic techniques using the facilities also available in the laboratory.


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Synchrotron-based Infrared Microscopy

A mid-infrared beamline at the SRC provides the opportunity to obtain chemical images with diffraction-limited (or better) resolution. This beamline was designed and constructed by LSS member Prof. C. Hirschmugl.


Scanning Electron Microscopes

The Department of Biological Sciences Electron Microscope Laboratory is equipped with an Hitachi S570 scanning electron microscope and an Hitachi H600 transmission electron microscope. The H600 may also be operated in STEM mode. Both microscopes are equipped with EDS systems for elemental analysis. Ultramicrotomes, critical point dryers, vacuum evaporators,sputter coaters and fully equipped darkrooms are also available for use.


In addition to these user facilities, LSS members share equipment. Some of the instruments available include:


High Resolution Transmission Electron Microscopy Lab (Physics)

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The Laboratory for High Resolution Transmission Electron Microscopy is equipped with a Hitachi H-9000NAR microscope with an attached Noran Energy Dispersive Spectrometer and a Gatan multi scan CCD camera controlled by an Emispec Vision 2 data acquisition system. The Specimen Preparation Laboratory includes a Buehler wafering saw and mechanical polishing table, a Fishione ultrasonic disc cutter and dimple grinder, a Gatan precision ion milling system and an Olympus research grade optical microscope with digital micrometer and reflection and transmission illumination.



Magnetic Properties Measurement System (Physics)

The MPMS uses sensitive SQUID detection system for measurements of samples with low magnetizations (~ 10-8 emu) over a temperature range of 1.9-400 K and in a magnetic field up to 5 Tesla. Several options are also available. The first option is the Sample Space Oven that will increase the temperature range from 400 to 800 K. The second option is the Resistivity Package that includes External Device Control and Manual Insertion Probe that allow transport measurements, including magnetoresistance and Hall effect. The third option is the Fiber Optic Sample Holder, which provides a convenient way to study the magnetization of a sample under the influence of light.


MBE-STM System (Physics)

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The system consists of five UHV chambers interconnected by a sample transfer stage (R2P2, Vacuum Generator, Inc.) through gate valves. The R2P2 is a multi-exit radial distribution system with six radial ports for sample transfer with a single drive gives both linear and rotational movements. The reactive MBE is equipped with a 10 keV RHEED and mass spectrometer, and five solid sources and ECR plasma source (MPDR 610i, Wavemat Inc.). The STM chambers house one Omicron variable-temperature STM (25 to 1500 K), and one low-temperature (5-300K) STM with q-plus sensor for non-contact AFM. Samples can be transferred from the MBE growth chamber, via the R2P2 to STM chambers without exposure to air.


VG 4” MBE System (Physics)

The VG MBE system consists of two VG 4” MBE (VH-80), one sample preparation chamber, and one loadlock chamber. One MBE is equipped with another Vavemat ECR plasma source.


AFM/STM Chamber (Chemistry)

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The ultrahigh vacuum chamber contains a a commercial atomic force/scanning tunneling microscope system designed and built by RHK based on the "Beetle" design. The sample can be transferred to the preparation chamber and cleaned and characterized and the sample can be dosed in situ and cooled to ~8 K using liquid helium or ~80 K using liquid nitrogen and heated either resistively or by electron bombardment.


RAIRS Chamber (Chemistry)

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Reflection absorption infrared spectra (RAIRS) are collected using a Bruker Equinox spectrometer. Light from the spectrometer is steered onto the sample at grazing (80 degrees) incidence and the reflected light is focused onto a liquid-nitrogen-cooled, mercury-cadmium-telluride (MCT) detector. It also contains a cell based on a six-way cross, which is used as an infrared analysis chamber for collecting reflection-absorption infrared data. The cell is isolated from the main part of the chamber by means of a gate valve and allows experiments to be carried out for surfaces in the presence of high pressures of gases.


LEIS/LEED/High-Pressure Cell Chamber (Chemistry)

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This is a multi-purpose ultrahigh vacuum chamber pump by means of a liquid-nitrogen filled diffusion pump operating at a base pressure of about 1x10-10 Torr. It contains an isolatable, small-volume, high-pressure cell that allows samples to be transferred directly from ultrahigh vacuum into the cell to allow catalytic reactions to be carried out. It is equipped with an external recirculation loop and a gas chromatograph for sample analysis. It is also doubly shielded by mu-metal to exclude magnetic fields and can be configured with a four-grid, retarding field analyzer to allow low-energy electron diffraction, intensity versus energy curves to be obtained, and can be equipped with an inert gas ion source and hemispherical electron/ion energy analyzer to allow low-energy ion scattering data to be collected.


UHV Tribometer (Chemistry)

This ultrahigh vacuum (UHV) tribometer consists of a 6" diameter chamber with 8" Conflat flange seals at the top and bottom. It is pumped by means of ion and titanium sublimation pumps and can attain a base pressure of <10-10 Torr. It is also equipped with a cylindrical-mirror analyzer for Auger analysis of both the sample and the tribopin. The normal load of tribo-arm can be varied up to 1.96 N (contact pressures ~30 MPa), and the sliding velocity can be varied between ~0.02 and ~10 mm/s.


XPS Chamber (Chemistry)

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This is a 12"-diameter chamber pumped by means of an ion pump and sublimation pump, operating at a base pressure of ~1x10-10 Torr. It is equipped with a computer-multiplexed Dycor quadrupole mass spectrometer for temperature-programmed desorption (TPD) experiments. It also contains a double-pass, cylindrical-mirror analyzer (CMA) system with co-axial electron gun and an X-ray source for collecting Auger and XPS data.